Specifications

Atomic lattice resolution
Low noise level of cantilever deflection detection system < 15 pm RMS
Closed-loop for reproducible tip positioning and long time position stability
Tip-scanning stand alone system, the only choice for simultaneous AFM and optical experiments
IR deflection detection laser source with low coherence for interference-free measurements
NanoWizard® Sense can be operated
1. On top of an inverted research microscope for AFM simultaneously with optical microscopy
  - Find a measurement spot optically on your sample by
    fluorescent labeling
  - Combine AFM with advanced optical techniques such as confocal, FCS, FRET, TIRF, STED, STORM/PALM or others
  - Exact positioning and overlay of optical and AFM data with the JPK DirectOverlay™ software module
2. Stand-alone based
  - Maximum flexibility even if no fluorescence is needed (the sample stage can be mounted on an optical microscope within a minute)
  - Free access to the sample area for micropipettes or electrical connections
  - Optional TopViewOptics™ vertical viewing system
The system can easily be upgraded to a full NanoWizard® 4 AFM system.

NanoWizard® Sense head

Rigid low-noise design and drift-minimized mechanics
Liquid-safe design with integrated vapor barrier, special encapsulated piezo drives and tip-moving design
Intelligent and automated approach optional with user defined parameters for soft landing
Transmission illumination with standard condensers for precise brightfield, DIC and phase contrast
Built-in optical filters for fluorescence without crosstalk
Scanner unit
- Flexure stage scanner design with decoupled, low mass z scanner
- 100 × 100 × 15 μm³ scan range for the head

True multi-user platform
User-programmable software
Automated sensitivity and spring constant calibration using thermal noise method
Outline™ mode for precise selection of a new scan area even in the optical image
Improved ForceWatch™ mode for force spectroscopy and imaging for cantilever-drift free measurements
Advanced oscilloscope functionality and online measurement of distances, cross sections etc.
Unlimited pixel resolution for imaging or force curves
Comprehensive force measurement with TipSaver™
Advanced spectroscopy modes such as various force clamp modes or user-defined ramp design, e.g. for temperature ramps, pulling speed or force feedback (optional)
Powerful Data Processing (DP) functions with full functionality for data export, fitting, filtering, edge detection, 3D rendering, FFT, cross section etc.
DataProcessing Image-Viewer for picture-in-picture display and export, including calibrated optical images
Powerful batch processing of force curves including WLC, FJC, step-fitting and other analysis
Image batch processing

Stages and sample holders for all major inverted optical microscope manufactures such as Zeiss, Nikon, Olympus and Leica
Fluid cells and temperature control options for measurements from -120°C up to 300°C
Electrochemistry solutions and accessories for electrical and magnetic measurements
Vibration and acoustic isolation from leading suppliers
System options for special applications such as, e.g., single-molecule or single-cell force spectroscopy, integration with upright and advanced optical microscopy techniques

QI™ and QI™ Advanced mode for quantitative imaging of mechanical, electrical and magnetic properties
MFM and EFM (see also QI™ mode)
Conductive AFM (see also QI™ mode)
STM
Piezo-Response Microscopy
Electrical spectroscopy modes
Electrochemistry with temperature control and optical microscopy
NanoLithography and NanoManipulation
ExperimentControl™ feature for remote experiment control
JPK ExperimentPlanner™ for designing a dedicated measurement workflow
JPK RampDesigner™ for custom designed force curve segments for clamp and ramp experiments
Nanoindentation
Scanning Thermal AFM
Environmental control options
DirectOverlay™ for combined AFM and optical microscopy
Additional z stage available with CellHesion® module