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20 results found for "topviewoptics":
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NanoWizard® Sense AFM
Specifications
Atomic lattice resolution Low noise level of cantilever deflection detection system < 15 pm…
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NanoWizard® Sense+ AFM
Specifications
Atomic lattice resolution Tip-scanning stand-alone system, the only choice for simultaneous AFM…
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CryoStage
JPK offers specialized cryostages together with NanoWizard® systems for cooling…
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Standard stage
Offers fine motion control for precise positioning of the AFM tip relative to the sample.
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TopViewOptics™
The optical system for non transparent samples or substrates such as HOPG, mica,…
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TopViewOptics™ for use with inverted optical microscopes
The optical system for use with inverted optical microscopes or the JPK BioMAT™.
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TopViewOptics™ module
Optical system to view tip and sample during experiments on opaque samples
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NanoWizard® 4 NanoScience AFM
Accessories
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NanoWizard® NanoOptics AFM
Accessories
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BioMAT™ Workstation
Accessories
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CellHesion® 200
Accessories
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CellHesion® module
Accessories
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NanoWizard® Sense AFM
Accessories
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NanoWizard® ULTRA Speed 2 AFM
Accessories
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NanoWizard 4 XP BioScience AFM
Accessories
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NanoWizard 4 XP NanoScience AFM
Accessories
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NanoWizard® Sense+ AFM
Accessories
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NanoWizard® ULTRA Speed 2 AFM
Specifications
True atomic resolution on inverted microscope in closed-loop (<0.015 nm RMS z height noise level) Ultra-low…
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NanoWizard 4 XP BioScience AFM
Specifications
Atomic lattice resolution on inverted microscope in closed-loop (<0.030 nm RMS z height noise…
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NanoWizard 4 XP NanoScience AFM
Specifications
Atomic lattice resolution on inverted microscope in closed-loop (<0.030 nm RMS z height noise…